Nondestructive monitoring of defect evolution in epitaxial CdTe thin layers grown on Si(111)

Journal of Physical Chemistry C v. 118, n. 4, p. 1968-1973, 2014 4.835 10.1021/jp409538p Oliveira, J. M.; Malachias, A.; Ospina Ramirez, C. A.; Ferreira, S. O. 2014