Nanostructural characterization of sputter deposited Ti-Nb coatings byautomated crystallographic orientation mapping

Thin Solid Films v. 661, p. 92-97, 2018 1.939 10.1016/j.tsf.2018.06.051 Gonzalez, E. D.; Afonso, C. R. M.; Nascente, P. A. P. 2018