Far infrared near normal specular reflectivity of Nix (SiO2)1- x (x = 1.0, 0.84, 0.75, 0.61, 0.54, 0.28) granular films

Journal of Alloys and Compounds 2010, v. 495, n. 2, p. 638- 641 2.135 10.1016/j.jallcom.2009.10.228 Massa, N. E.; Denardin, J. C.; Socolovsky, L.M.; Knobel, M.; Cruz, F. P.; Zhang, X. X. 2010