Experimental evidence of transition between dynamical and kinematical diffraction regimes in ion-implanted Si observed through X-ray multiple-beam diffraction mappings

Applied Physics Letters v. 109, n. 14, p. 141901, 2016 3.142 10.1063/1.4963791 Lang, R.; Calligaris, G. A.; Bettini, J.; Santos, A. O. dos; Cardoso, L. P. 2016