Determination of High-Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by Kelvin Probe Force Microscopy

Langmuir v. 31, n. 41, p. 11339-11343, 2015 4.457 10.1021/acs.langmuir.5b01786 Salomão, F. C.; Lanzoni, E. M.; Costa, C. A. R.; Deneke, C.; Barros, E. B. 2015