Communication of LNNano – October 21st, 2013
The Electron Microscopy Lab (LME) from LNNano received the newest Helios Nanolab Dualbeam 660 from FEI Co (http://www.fei.com/products/dualbeam/helios-nanolab/). This new machine will improve the capabilities for sample preparation for TEM and sample analysis. Samples for TEM can be prepared in very efficient way in a very short time. The new dualbeam can be used to explore the material not only on the surface. The ion-beam can selectively remove the material and expose what is hidden under it. All combined with EDS and EBSD analytical instruments. It also can be used for nanopatterning to create prototypes. The installation will begin at the end of October and it will be open to the facility users as soon as it is commissioned.