International Workshop on Advanced and In-situ Microcopies of Functional Nanomaterials and Devises (IAMNano 2104)

TOPICS  Imaging with advanced methods of aberration-corrected electron microscopy Spectroscopic characterisations of materials properties In situ microscopy Surface probe techniques Diffraction techniques Precision sample preparation Applications to characterisation of functional nanomaterials and devices, thin films, surfaces and interfaces: metals, semiconductors, superconductors, magnetic materials, nuclear and composite materials.   Veja mais aqui