SPECTROSCOPY

Confocal Raman Spectrometer (Horiba, XploRA™ plus )

Description

The confocal Raman spectroscopy technique allows the acquisition of specific mappings and Raman spectra (nano) materials, including assays temperature range -196 to 600 ° C. Coupling with the optical microscope allows us to obtain a visualization of particles or layers with dimensions below 1 micrometer with high magnification and spatial resolution, even in a three-dimensional (3D) configuration.

Specifications

• 3 lasers (473, 532 and 638 nm) and 6 power filters (0.1, 1.10.25, 50, 100%)
• CCD type detector (1024×256 pixels)
• Olympus BX optical microscope with 4 lenses (5, 10, 100x, and 50x LWD) and XYZ table attached to the equipment
• Accessory for temperature control for in situ analysis (-196 and 600 °C)
• Software for data acquisition and processing: LabSpec 6 with NavMap™, NavSharp and ViewSharp modules.
• Samples in liquid and solid state

Techniques

• Punctual Raman spectra
• Linear, 2D and 3D mappings

Description

Specifications

Techniques

Confocal Raman Spectrometer (Horiba, XploRA™ plus )

Description

The confocal Raman spectroscopy technique allows the acquisition of specific mappings and Raman spectra (nano) materials, including assays temperature range -196 to 600 ° C. Coupling with the optical microscope allows us to obtain a visualization of particles or layers with dimensions below 1 micrometer with high magnification and spatial resolution, even in a three-dimensional (3D) configuration.

Specifications

• 3 lasers (473, 532 and 638 nm) and 6 power filters (0.1, 1.10.25, 50, 100%)
• CCD type detector (1024×256 pixels)
• Olympus BX optical microscope with 4 lenses (5, 10, 100x, and 50x LWD) and XYZ table attached to the equipment
• Accessory for temperature control for in situ analysis (-196 and 600 °C)
• Software for data acquisition and processing: LabSpec 6 with NavMap™, NavSharp and ViewSharp modules.
• Samples in liquid and solid state

Techniques

• Punctual Raman spectra
• Linear, 2D and 3D mappings

Description

Specifications

Techniques

X-ray excited photoelectron spectrometer (XPS)

(Thermo Scientific, K-alpha)

Description

The XPS technique is used for the chemical characterization of very thin surface layers in the order of 1-10 nm. It is based on the photoelectric effect. Briefly, the samples are irradiated with X-rays and the photoelectrons emitted by them are resolved as a function of their kinetic energies. Through the analysis of the spectra it is possible to obtain the elemental composition, the chemical and electronic state of the elements.

Specifications

• X-ray source: Al Ka microfocus with variable spot size
• Analyzer: double focus hemispherical with 128 detection channels
• Ion cannon and ion cluster
• Load compensation system
• Avantage software for data acquisition and processing
• Maximum sample size: 60 mm (c) x 60 mm (w) x 20 mm (h)

Techniques

• Spectroscopy in selected area
• Elementary composition (1% detection limit)
• High resolution analysis (detection limit 0.1%)
• In-depth analysis, including insulating samples
• Angle-resolved analysis
• Compositional image

Description

Specifications

Techniques

X-ray excited photoelectron spectrometer (XPS)

(Thermo Scientific, K-alpha)

Description

The XPS technique is used for the chemical characterization of very thin surface layers in the order of 1-10 nm. It is based on the photoelectric effect. Briefly, the samples are irradiated with X-rays and the photoelectrons emitted by them are resolved as a function of their kinetic energies. Through the analysis of the spectra it is possible to obtain the elemental composition, the chemical and electronic state of the elements.

Specifications

• X-ray source: Al Ka microfocus with variable spot size
• Analyzer: double focus hemispherical with 128 detection channels
• Ion cannon and ion cluster
• Load compensation system
• Avantage software for data acquisition and processing
• Maximum sample size: 60 mm (c) x 60 mm (w) x 20 mm (h)

Techniques

• Spectroscopy in selected area
• Elementary composition (1% detection limit)
• High resolution analysis (detection limit 0.1%)
• In-depth analysis, including insulating samples
• Angle-resolved analysis
• Compositional image

Description

Specifications

Techniques

SCATTERING

X-ray microtomography (Bruker (SkyScan) 1272)

Description

The microtomography technique detects X-rays transmitted through different types of materials. Through specialized software, it reconstructs the 2D images in three dimensions, revealing details about the shape and composition of the internal structures, in micrometric or submicrometric scale. In addition to 2D and 3D images of the samples, this technique also allows obtaining quantitative data, such as porosity, density between different phases, calculation of particle size and distribution, among others.

Specifications

•Fonte de raios X: 20-100 kV
•Detector de raios X: câmera CCD de 16Mp (4904×3280 pixels) opticamente acoplada a um cintilador
•Resolução: 0,35 mm na resolução máxima da câmera
•Tamanho máximo da amostra: 75 mm de diâmetro e 70 mm de comprimento
•Softwares para aquisição e tratamento de imagens 2D e 3D (SkyScan; NRecon; DataViewer; CTVox; CTan; CTVol)

Description

Specifications

X-ray microtomography (Bruker (SkyScan) 1272)

Description

The microtomography technique detects X-rays transmitted through different types of materials. Through specialized software, it reconstructs the 2D images in three dimensions, revealing details about the shape and composition of the internal structures, in micrometric or submicrometric scale. In addition to 2D and 3D images of the samples, this technique also allows obtaining quantitative data, such as porosity, density between different phases, calculation of particle size and distribution, among others.

Specifications

•Fonte de raios X: 20-100 kV
•Detector de raios X: câmera CCD de 16Mp (4904×3280 pixels) opticamente acoplada a um cintilador
•Resolução: 0,35 mm na resolução máxima da câmera
•Tamanho máximo da amostra: 75 mm de diâmetro e 70 mm de comprimento
•Softwares para aquisição e tratamento de imagens 2D e 3D (SkyScan; NRecon; DataViewer; CTVox; CTan; CTVol)

Description

Specifications

X-ray diffractometer (Bruker, D8 Advance Eco)

Description

The X-Ray Diffraction (XRD) technique is the main crystallographic analysis for determining the structure of materials as symmetry spatial group, network parameters and microstructure. The D8 has variable primary and secondary optics and different types of samplers that together allow using different modes or geometries of operation in the same equipment, including Bragg-Brentano geometry, parallel beam (Göbel mirror) and high-resolution with the Ge monochromator. Bruker D8 Advance Eco is perfectly suitable for all types of samples, including powder, bulk materials and thin films (amorphous, polycrystalline and epitaxial).

Specification

  • Two radiation sources from Cu (8 keV, Qmax ≈ 8 Å-1) and Mo (17 keV, Qmax ≈ 17 Å-1);
  • TRIO primary optics composed of (1) Motorized Divergent Slit for Bragg-Brentano Geometry, (2) Göbel Mirror for parallel beam analysis and (3) Germanium Monochromator for HRXRD with low divergence and presence only of Cu Kα;
  • Four types of samplers such as (1) rotation stage, (2) motorized table, (3) heating oven up to 1600 °C and (4) capillary for spreading techniques in the transmission mode;
  • TWIN secondary optics composed of (1) motorized slit for Bragg-Brentano geometry and (2) equatorial soller for parallel beam geometry;
    LYNXEYE XE detector (spot mode-0D and line-1D) that does not require the use of a kβ filter and allows the removal of 100% of the Fe fluorescence signal using Cu radiation;

Techniques

  • Phase identification;
  • Quantitative phase analysis;
  • Microstructure analysis;
  • Selection of structure and refinement;
  • Grazing Incidence Diffraction (GID);
  • High-Resolution X-ray Diffraction (HRXRD);
  • X-ray Reflectometry (XRR);
  • Analysis of Pair Distribution Function (PDF).

Description

Specification

Techniques