ELECTRONIC MICROSCOPY

The crystallographic structure of materials, as well as their chemical composition and the binding states of the constituent chemical elements are routinely analyzed and visualized in electronic microscopes at atomic, nanometric and micrometric levels. Technological advances over the last few decades also allow the observation and analysis in situ of dynamic phenomena with increasing precision and reproducibility in atomic and nanometric dimensions.

LNNano provides the national and international scientific community with alternatives for accessing a wide range of conventional and advanced techniques of scanning, transmission and double-beam electron microscopy.

Infrastructure

JEOL JEM-2100

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JEOL JEM-2100

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JEOL JEM-2100F

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JEOL JEM-2100F

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Thermo Fisher/FEI Titan Cubed Themis

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Thermo Fisher/FEI Titan Cubed Themis

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Thermo Fisher Scientific Quanta 650 FEG

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Thermo Fisher Scientific Quanta 650 FEG

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Thermo Fisher Scientific Inspect F50

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Thermo Fisher Scientific Inspect F50

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Thermo Fisher Scientific Helios NanoLab 660

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Thermo Fisher Scientific Helios NanoLab 660

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Image gallery – Techniques and applications