LNNano - Brazilian Nanotechnology National Laboratory

Technical Specfications

This microscope uses a high-brightness and high-coherence electron beam to carry out ultra-high resolution microchemical analysis using its attached energy dispersive x-ray spectrometer (EDS) and electron energy loss spectrometer (EELS). The 2100 FEG-TEM is also equipped with a scanning image observation device, thus becoming a so-called scanning transmission electron microscope (STEM). This enables researchers to observe and investigate samples in a scanning mode that further expands its applications; for instance, to acquire a material’s chemical composition from a small point or a line profile, or to reveal elemental distribution maps.

This FEG-TEM is also equipped with a Gatan imaging filter that comes with sophisticated software covering all aspects of energy-filtered imaging and energy-loss spectroscopy (EELS). Energy-filtering is a powerful technique that can dramatically improve image contrast and resolution in the TEM as well as quickly obtain highly sensitive elemental maps of materials. By contrast, energy-filtering transmission electron microscopy (EFTEM) is capable of producing electron images from only a narrow range of energies.


Accelerating Voltage: 160, 200 kV

Electron Gun: ZrO/W(100) Schottky field emission electron source

Scanning System: JEOL SIOD digital scanning system with HAADF detector and,        Gatan with BF and ADF detector


      0.19 nm (point-to-point)

      0.10 nm (lattice)

      0.14 nm (STEM lattice)

Spot Size:

     2—5 nm (TEM mode)

     0.5—2.4 nm (Analytical mode)

Specimen Tilt: +/- 25° (X/Y)

Image Recording: CCD and/or film

EDS: Noran system

ELS/Imaging Filter: Gatan (863 GIF Tridiem) system

CCD camera: Gatan  2k x 2k