LNNano - Brazilian Nanotechnology National Laboratory

Scanning Electron Microscope (SEM):

Transmission Electron Microscope (TEM):

Sample Preparation:

  • Ion mill: Gatan PIPS and Gatan Dual Mill.
  • Low energy ion mill: Linda Gentle Mill.
  • Ultrasonic Cutter.
  • South Bay Tech 650 Low Speed Diamond Wheel Saw.
  • Gatan 656 Dimple Grinder.
  • Lapping Fixtures and Polishers.
  • Tripod Polisher.
  • Bal-Tec SCD 005 Coater (Gold).
  • Leica EM MED 020 Coater (Chromium).
  • Ultracryomicrotome RMC.
  • Optical Microscopes.


  • Gatan DigitalMicrograph (DM).
  • TVIPS EMMenu and EMTool.
  • HREM plug-ins for DM: Geometrical Phase Analysis (GPA), Peak Pairs Analysis (PPA), Focal and Tilt Series Reconstruction (FTSR), Iterative Wave Function Reconstruction (IWFR), and Multivariate Statistical Analysis (MSA).
  • JEMS for HRTEM Simulation.

Operation manuals are available for most of the equipments.