LNNano - Brazilian Nanotechnology National Laboratory

Scanning Electron Microscope (SEM):

• JEOL 5900LV (SEM-LV).
• JEOL 6330 (SEM-FEG).
• FEI Inspect F50 (SEM-FEG HR).
• FEI Quanta 650 (SEM-FEG ENV).

Transmission Electron Microscope (TEM):

• JEOL 3010 (TEM-HR).
• JEOL 2100 (TEM-MSC).
• JEOL 2100F (TEM-FEG).

Sample Preparation:

• Ion mill: Gatan PIPS and Gatan Dual Mill.
• Low energy ion mill: Linda Gentle Mill.
• Ultrasonic Cutter.
• South Bay Tech 650 Low Speed Diamond Wheel Saw.
• Gatan 656 Dimple Grinder.
• Lapping Fixtures and Polishers.
• Tripod Polisher.
• Bal-Tec SCD 005 Coater (Gold).
• Leica EM MED 020 Coater (Chromium).
• Ultracryomicrotome RMC.
• Optical Microscopes.

Software:

• Gatan DigitalMicrograph (DM).
• TVIPS EMMenu and EMTool.
• HREM plug-ins for DM: Geometrical Phase Analysis (GPA), Peak Pairs Analysis (PPA), Focal and Tilt Series Reconstruction (FTSR), Iterative Wave Function Reconstruction (IWFR), and Multivariate Statistical Analysis (MSA).
• JEMS for HRTEM Simulation.

Operation manuals are available for most of the equipments.