Scanning Electron Microscope (SEM):
- JEOL 5900LV (SEM-LV).
- JEOL 6330 (SEM-FEG).
- FEI Inspect F50 (SEM-FEG HR).
- FEI Quanta 650 (SEM-FEG ENV).
Transmission Electron Microscope (TEM):
Sample Preparation:
- Ion mill: Gatan PIPS and Gatan Dual Mill.
- Low energy ion mill: Linda Gentle Mill.
- Ultrasonic Cutter.
- South Bay Tech 650 Low Speed Diamond Wheel Saw.
- Gatan 656 Dimple Grinder.
- Lapping Fixtures and Polishers.
- Tripod Polisher.
- Bal-Tec SCD 005 Coater (Gold).
- Leica EM MED 020 Coater (Chromium).
- Ultracryomicrotome RMC.
- Optical Microscopes.
Software:
- Gatan DigitalMicrograph (DM).
- TVIPS EMMenu and EMTool.
- HREM plug-ins for DM: Geometrical Phase Analysis (GPA), Peak Pairs Analysis (PPA), Focal and Tilt Series Reconstruction (FTSR), Iterative Wave Function Reconstruction (IWFR), and Multivariate Statistical Analysis (MSA).
- JEMS for HRTEM Simulation.
Operation manuals are available for most of the equipments.