LNNano - Brazilian Nanotechnology National Laboratory

Available SPM Instruments

The LCS provides a number of different scanning probe microscopy techniques implemented in our open service facilities. Proposals can be submitted to the Atomic Force Microscopes. Proposals will be mainly evaluated for their technical feasibility and than assigned to one of the microscopes. We recommend to contact us before submitting.

New users are trained according to their needs by the staff of the LCS team and can work than freely during their time on the microscope. Advanced users are allowed to work out of normal working hours and at weekends by them self.

Scanning Nearfield Optical Microscope and AFMIR Instrument (SNOM/AFMIR)

A Anasys NanoIR2-s system usable for scanning nearfield optical microscopy and NanoIR techniques.

The instrument unites optical methods with scanning probe microscopy. We can carry out SNOM using a single line CO2 laser. This technique has proven powerful for the characterization and investigation of graphene and other 2D materials. Furthermore, the instrument is equipped with a quantum cascade laser in the range from 1540 to 1860 cm-1 usable to do AFMIR. This technique allows the acquisition of lateral resolved infrared spectra in this wavelength range. The technique is mainly usable to characterize organic substances liker polymers (normally prepared as cross-section with a thickness between 100 nm to 500 nm) or single organic layers or molecules on Au surfaces.

For more information visit ANASYS page.


Atomic Force Microscope (AFM I)

A Park NX10 atomic force microscope (AFM) acquired in 2013. The instrument has a scan width of 100×100 µm and a z-hub of ca. 15 µm. The resolution in z is 0.006 nm due to the modern 24-bit electronics. The instrument fully open to users since 2015.
Beside topography, a wide variety of SPM techniques can be carried out with the instrument – to mention is magnetic force microscopy (MFM), electrical force microscopy (EFM), Kelvin probe force microscopy (KPFM/KFM), working in liquid, sample heater. Contact us for information over further possibilities.
The microscope itself is mounted inside a glove box allowing a controlled atmosphere, especially the humidity can be varied from 0.1% to 80% relative water saturation.

Atomic Force Microscope (AFM II)

A NanoSurf Flex atomic force microscope. The instrument is been provided by Nanosurf to us as demonstration instrument free of charge. The instrument has a 100×100 µm scan stage and a modern 24-bit electronic for analog/digital conversation. All standard techniques like AFM, MFM and EFM as well as a liquid cell for the instrument are available.
Whereas the instrument is accessible to users, we mainly use it for internal research and instrumentation work like combination of KFM with MF microscopy. We locate the microscope inside a self-build environmental box allowing the control of the humidity between 5% to 60%.