LNNano - Brazilian Nanotechnology National Laboratory

X-Ray Diffractometer


The X’Pert PRO Materials Research Diffractometer XL PANanalytical system is a flexible system for the study of x-ray diffraction with capacity to perform various types of experiments in different types of materials such as powders, thin films, nano-structured materials, semiconductor wafers or large dimensions bulk samples. Among the possible measurements is diffraction, reflectometry, texture, residual stresses, and micro diffraction.

The diffractometer is equipped with three x-ray tubes (chromium, copper and molybdenum), three detectors (Proportional, X’Celerator and Scintillator), three incident optical beam (fixed notches support with automatic attenuator, x-ray lenses and monocapilar) and two diffracted optical beam (fixed notches support and parallel plate support).

Proposals are submitted through the CNPEM User Portal. Only researchers that hold permanent position can submit proposals. For this, you must register at the User Portal and submit a Research Proposal through this digital platform. After choosing the “PANalytical X-Ray Diffractometer” equipment under the LNNano open facilities, fill the form with your research data and submit your proposal.

Scheduling is done continuously after technical viability is evaluated, usually 2-5 workdays after submission. No previous experience with diffractometers is required, but theoretical knowledge of the technique is very important to correctly interpret the results.

User Information

The maximum number of samples will be defined by the scientific committee responsible for this facility depending on the type of analysis requested.

Samples to be analyzed must follow the rules below:

  • Maximum allowed dimensions: 100 mm x 100 mm (length x width) and 30 mm (height). Samples with larger length and width can be mounted in the machine, but analysis will be limited to a 100 mm x 100 mm area.
  • Maximum allowed weight: 600 g (including sample holder, which is ca. 150 g).
  • Surface finish: grinding and polishing is desired, but if the surface layer is of particular interest or the material can suffer a phase transformation during these steps, analysis can be done in the material as received, although it is possible that the results suffer from loss of resolution and/or peak width increase.

ATTENTION: the X’Pert PRO MRD XL PANanalytical has a vertical holder and powders must be measured in this position, which usually requires, for measurements, that the powder to be compressed in a pellet or fixed using double-sided tape, modeling clay, removable glue or vacuum grease, which can cause irreversible damage to the sample.