Graduated in Physics from the University of Antioquia, Medellín, Colombia in 2003 and holds a PhD in Physics from the Brazilian Center for Research in Physics in 2010. He completed a postdoctoral fellowship in 2012 at LNNano working with semiconductor materials and electron microscopy characterization techniques. He provides technical and scientific support for the execution of scientific proposals by external and internal users that require sample preparation by conventional cross-section and plane view methods, as well as applying basic and advanced image, diffraction and spectroscopy characterization techniques in electron microscopes. transmission without and with corrected spherical aberration, and the corresponding data processing. His interests cover subjects such as the simulation of high-resolution images, modification of transmission electron microscopy sample holders, electron tomography, corrected spherical aberration and in situ electron microscopy.

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