The LCS provides a number of different scanning probe microscopy techniques implemented in our open service facilities. Proposals can be submitted to the Atomic Force Microscopes. Proposals will be mainly evaluated for their technical feasibility and than assigned to one of the microscopes. We recommend to contact us before submitting.
New users are trained according to their needs by the staff of the LCS team and can work than freely during their time on the microscope. Advanced users are allowed to work out of normal working hours and at weekends by them self.
Scanning Nearfield Optical Microscope and AFMIR Instrument (SNOM/AFMIR)
A Anasys NanoIR2-s system usable for scanning nearfield optical microscopy and NanoIR techniques.
The instrument unites optical methods with scanning probe microscopy. We can carry out SNOM using a single line CO2 laser. This technique has proven powerful for the characterization and investigation of graphene and other 2D materials. Furthermore, the instrument is equipped with a quantum cascade laser in the range from 1540 to 1860 cm-1 usable to do AFMIR. This technique allows the acquisition of lateral resolved infrared spectra in this wavelength range. The technique is mainly usable to characterize organic substances liker polymers (normally prepared as cross-section with a thickness between 100 nm to 500 nm) or single organic layers or molecules on Au surfaces.
For more information visit ANASYS page.
Atomic Force Microscope (AFM I)
Atomic Force Microscope (AFM II)